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해외 우수한 분석, 측정, 계측기기 제조회사의 독점 대리점 !
어플리케이션
Thin Film measurements
제품사양
| Thinfilm Measurement | |
|---|---|
| Spectrometer | AvaSpec-2048CL-EVO Grating UA (200-1100 nm), 100 μm slit , DCL-UV/VIS-200, OSC-UA |
| Layer thickness | 10 nm- 50 μm, 1 nm resolution |
| Software | AvaSoft-Thinfilm |
| Light source | AvaLight-DHc Compact deuterium-halogen light source |
| Fiber optics | FCR-7UVIR200-2-ME reflection probe UV/VIS, 2 m, SMA Thinfilm stage to hold reflection probe |
| Accessories | Thinfilm-standard Tile with 2 calibrated different thickness layers of SiO2 and a reference layer Thinfilm-standard-multilayer Thin Film Reference, Box With Reference sample, a 2-layer sample and a 5-layer sample |