제품소개
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일사량/열유속/열전도도계
Thermal ConductivityTHASYS
BEST Good
제품사양
| THA01 열전도도계 | |
|---|---|
| Test method | ASTM C 1114-98 |
| Sensitivity traceability (ΔT) | ANSI MC96.1-1982 |
| Temperature range | -30 to +120 °C |
| Accuracy (λ) (examples) | all @ 20 °C |
| @ H/λ> 15 10-3m2K/W | +/- 3% (2 samples) |
| @ H/λ> 5 10-3m2K/W | +/- 6% (2 samples) |
| @ H/λ> 5 10-3m2K/W | +/- 3% (4 samples) |
| @ H/λ> 2.5 10-3m2K/W | +/- 3% (6 samples) |
| @ H/λ> 2.5 10-3m2K/W | +/- 3% (6 samples) |
| @ H/λ> 0.5 10-3m2K/W | Worse than 14% (6 samples) |
| Repeatability (λ) | +/- 1% @ 20 °C |
| Total measurement time | 3000 s (typical) |
| Sample thickness | H = 0.1 - 6 mm (see accuracy for stacking) |
| Sample surface A | Preferred: 70 x 110 mm, always > 50 x 50 mm |
| Traceability | NPL National Physical Laboratory UK |
| Pressure cell (optional) | 200 N or max 80.0 kN/m2 |
| MCU specifications | |
| Differential temperature readout | 0.5 μV @ 0 - 30 °C |
| Pt100 readout | +/- 0.2 °C @ 20 °C |
| Voltage input/output | 220-110 VAC / 15 VDC |
| Communication | RS232 |