해외 우수한 분석, 측정, 계측기기 제조회사의 독점 대리점 !
MSP500 | |
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Detector | CCD Array with 2048 pixels for UV-Vis and InGaAs Arrary for NIR |
Light Source | High Power DUV and Visible |
Stage | Black Anodized Aluminum Alloy with motorized travel distance 100 mm by 75 mm |
Long Working Distance Objectives | 10x, 15x, 50x (one DUV objective included) |
Communication | USB |
Measurement Type | Reflection/Transmission spectra, Film thickness/refractive index and feature dimensions |
Computer & Monitor | Intel Core 2 Duo Processor with 200GB Hard drive and DVD+RW Burner plus 19” LCD Monitor |
Power | 110 - 240 VAC /50-60Hz, 3 A |
MSP500 | |
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Wavelength range | 250 to 1700 nm |
Wavelength resolution | 1 nm for UV-Vis and 5 nm for NIR |
Spot Size | 100 μm (4x), 40 μm (10x), 30 μm (15x), 8 μm (50x) |
Substrate Size |
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Measurable thickness range | 2 nm to 50 μm |
Measurement Time | 2 ms minimum |
Accuracy | Better than 0.5% (comparing with ellipsometry results for Thermal Oxide sample by using the same optical constants) |
Repeatability | < 2 Å (1 sigma from 50 thickness readings for 1500 Å Thermal SiO2 on Si Wafer) |
MSP500 |
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Wavelength extension to Further DUV or longer NIR range (~2500nm) |
Higher power DUV optics for smaller spot size |
Customized configuration for special applications |
Heating and Cooling Stage for dynamic study | Optional stage size holding samples up to 300mm |
Higher wavelength range resolution down to 0.1nm |
Various filters for special applications |
Add-on accessories for fluorescence measurement |
Add-on accessories for polarizing applications |
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MSP500 |
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Forensics, Biological films and materials |
Inks, Mineralogy, Pigments, Toners |
Optical coatings, TiO2, SiO2, Ta2O5..... |
Semiconductor compounds |
Functional films in MEMS/MOEMS |
Amorphous, nano and crystalline Si |
Pharmaceuticals, Medial Devices |
Measured Transmission Spectra for Color Pixels | |
Measured Film Thickness of TiO2 on Silicon | |
Measured Reflection Spectra over a MEMS Device Inside/Outside a Via-hole | |
4. Digital Imaging Function in MSP500 System | |