해외 우수한 분석, 측정, 계측기기 제조회사의 독점 대리점 !
SE300BM | |
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Detector | Detector Array |
Light Source | Adjustable intensity Vis-NIR Light Source |
Incident Angle Change | Manual |
Stage | Black Anodized Alumnium Sample holder for up to 200 mm or 150 x 150 mm samples |
Software | |
Computer & Monitor | Intel Duo Core 2.0 GHz, 19" Wide Screen LCD |
Power | 110 - 240 VAC /50-60Hz, 6 A |
SE300BM | |
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Wavelength range | 400 to 1100 nm |
Wavelength resolution | ~ 1 nm |
Spot Size | 1 to 5 mm variable |
Incident Angle Range | 0 to 90 degree |
Incident Angle Change Resolution | 5 degree interval |
Sample Size | Up to 200 mm in diameter or 150 mm square |
Substrate Size | Up to 20 mm thick |
Measurable thickness range | 5 nm to 30 μm |
Measurement Time | ~ 1s/Site |
Accuracy | Better than 0.25% |
Repeatability | < 1 Å (1 sigma from 50 thickness readings for 1500 Å Thermal SiO2 on Si Wafer) |
SE300BM |
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Automatic Goniometer for Incident angle changes |
Mapping Stage (X-Y mode or Rho-Theta mode) |
Heating /Cooling Stage |
Vertical Sample Mounting Goniometer |
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Combined with Microspectrophotometer (MSP) for patterned sample measurement with digital imaging functions |
SE300BM |
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Forensics, Biological films and materials |
Inks, Mineralogy, Pigments, Toners |
Optical coatings, TiO2, SiO2, Ta2O5..... |
Semiconductor compounds |
Functional films in MEMS/MOEMS |
Amorphous, nano and crystalline Si |
Various TCO films (ITO, FTO, IZO, AZO...) |